BS IS0 20263:2017 BSl Standards Publication Licensedcopy:UniversityofEdinburgh,UniversityofEdinburgh,Versionco Microbeam analysis - Analytical electron microscopy - Method for the determination of interface position in the cross-sectional image of the layered materials bsi. BSISO20263:2017 BRITISH STANDARD Nationalforeword This British Standard is the UK implementation of IS020263:2017. The UKparticipation inits preparation was entrusted to Technical Licensed copy: University of Edinburgh, University of Edinburgh, Version correct as of 31/12/2018 Committee Cll/9,Microbeamanalysis. Alistoforganizations representedonthis committee can be obtainedon requesttoits secretary. This publication does not purport to include all the necessary provisions ofa contract.Users areresponsible for its correctapplication. @TheBritish Standards Institution 2017 Published by BSI Standards Limited2017 ISBN9780580893452 ICS37.020;71.040.50 CompliancewithaBritish Standard cannotconfer immunityfrom legal obligations. This British Standard was published under the authority of the Standards Policy and Strategy Committee on 31December 2017. Amendments/corrigendaissuedsincepublication Date Text affected BS ISO 20263:2017 ISO INTERNATIONAL STANDARD 20263 First edition 2017-11-15 Licensed copy: University of Edinburgh, University of Edinburgh, Version correct as of 31/12/2018 Microbeam analysis Analytical electron microscopy - Method for the determination of interface position in the cross-sectional image of the layered materials Analyseparmicrofaisceaux-Microscopieélectroniqueanalytique Méthodededéterminationdelapositiond'interfacedansIimage decoupetransversaledesmatériauxencouches Reference number ISO 20263:2017(E) ISO @IS02017